中国科学院上海光学精密机械研究所机构知识库
Advanced  
SIOM OpenIR  > 高功率激光物理国家实验室  > 期刊论文
题名:
波片相位延迟的精确测量及影响因素分析
其他题名: Precise Measurement and Factors Analysis for Phase Retardation of Wave Plate
作者: 薄锋 ; 朱健强 ; 康俊
关键词: 激光技术 ; 调制光源和解调技术 ; 除法技术 ; 波片 ; 相位延迟 ; 精度分析 ; laser technique ; modulated light source and demodulation technique ; division technique ; wave plate ; phase retardation ; accuracy analysis
刊名: 中国激光
发表日期: 2007
卷: 34, 期:6, 页:851
收录类别: ei
摘要: 提出一种精确测量波片相位延迟的方法。将待测波片置于起偏器和检偏器之间,转动待测波片和检偏器至不同的位置并探测输出的光强,得到波片的相位延迟。采用光源调制技术和解调技术,抑制了连续光所无法克服的背景光干扰和电子噪声的干扰;将光路分为测量光路和参考光路,采用软件除法技术,消除了光源波动的影响,从而实现波片相位延迟的精确测量。详细分析了影响测量精度的误差因素,主要有光源波长变化、温度变化、入射角倾斜、转台转角误差和光源波动,计算了1064 nm波长时厚度为0.52 mm的λ/4多级结晶石英波片产生的相位延迟误差; A method for precisely measuring the phase retardation of wave plate is presented. In this method, a test wave plate is placed between a polarizer and an analyzer, with the polarizer and the analyzer being rotated to different position, the output power is tested and the phase retardation of the wave plate is reached. The modulated light source and the demodulation technique are used to erase the noises, which are helpless for continuous light, arise from background light and electronics. Since the light path is divided into measurement light path and reference light path and the software division technology is used, the influence of light fluctuation is eliminated and the phase retardation of wave plate can be measured precisely. Main error factors that degrade the measurement accuracy are analyzed in detail, which are wavelength change of the light source, temperature change of surrounding environment, oblique incidence of the light, rotational angle error of the sample carriers and fluctuation of the light power. Phase retardation errors that arise from the above mentioned factors for a piece of crystal quartz plate with thickness of 0.52 mm and phase retardation being 90° at 1064 nm are analyzed and calculated. The influence of light fluctuation is greatly improved after using division technique, and the total error is ±1.58°. The quartz wave plate with thickness of 0.52 mm is tested experimentally, and its phase retardation is 91.06°±1.78°, which consists with the theoretical analysis. Methods about measurement and error analysis can also be used for other wave plates.
语种: 中文
内容类型: 期刊论文
URI标识: http://ir.siom.ac.cn/handle/181231/3174
Appears in Collections:高功率激光物理国家实验室_期刊论文

Files in This Item: Download All
File Name/ File Size Content Type Version Access License
2007_719.pdf(441KB)----开放获取--View Download

Recommended Citation:
薄锋,朱健强,康俊. 波片相位延迟的精确测量及影响因素分析[J]. 中国激光,2007,34(6):851, 856.
Service
Recommend this item
Sava as my favorate item
Show this item's statistics
Export Endnote File
Google Scholar
Similar articles in Google Scholar
[薄锋]'s Articles
[朱健强]'s Articles
[康俊]'s Articles
CSDL cross search
Similar articles in CSDL Cross Search
[薄锋]‘s Articles
[朱健强]‘s Articles
[康俊]‘s Articles
Related Copyright Policies
Null
Social Bookmarking
Add to CiteULike Add to Connotea Add to Del.icio.us Add to Digg Add to Reddit
文件名: 2007_719.pdf
格式: Adobe PDF
此文件暂不支持浏览
所有评论 (0)
暂无评论
 
评注功能仅针对注册用户开放,请您登录
您对该条目有什么异议,请填写以下表单,管理员会尽快联系您。
内 容:
Email:  *
单位:
验证码:   刷新
您在IR的使用过程中有什么好的想法或者建议可以反馈给我们。
标 题:
 *
内 容:
Email:  *
验证码:   刷新

Items in IR are protected by copyright, with all rights reserved, unless otherwise indicated.

 

 

Valid XHTML 1.0!
Powered by CSpace