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Coulomb interaction-induced jitter amplification in RF-compressed high-brightness electron source ultrafast electron diffraction
Qi, Yingpeng; Pei, Minjie; Qi, Dalong; Li, Jing; Yang, Yan; Jia, Tianqing; Zhang, Shian; Sun, Zhenrong; yangyan@siom.ac.cn; zrsun@phy.ecnu.edu.cn
2017
发表期刊New J. Phys.
卷号19
摘要We have theoretically and experimentally demonstrated an RF compression-based jitter-amplification effect in high-brightness electron source ultrafast electron diffraction (UED), which degrades the temporal resolution significantly. A detailed analysis and simulations reveal the crucial role of the longitudinal and transverse Coulomb interaction for this jitter-amplification effect, which accord very well with experimental results. An optimized compact UED structure for full compression has been proposed, which can suppress the jitter by half and improve the temporal resolution to sub-100 fs. This Coulomb interaction-induced jitter amplification exists in nearly the whole ultrafast physics field where laser-electron synchronization is required. Moreover, it cannot be suppressed completely. The quantified explanation for the mechanism and optimization provides important guidance for photocathode accelerators and other compression-based ultrashort electron pulse generation and precise control.
文章类型Article
部门归属强光
DOI10.1088/1367-2630/aa59ad
资助者National Natural Science Fund [51132004, 11474096]; Shanghai Municipal Science and Technology Commission [14JC1401500] ; National Natural Science Fund [51132004, 11474096]; Shanghai Municipal Science and Technology Commission [14JC1401500] ; National Natural Science Fund [51132004, 11474096]; Shanghai Municipal Science and Technology Commission [14JC1401500] ; National Natural Science Fund [51132004, 11474096]; Shanghai Municipal Science and Technology Commission [14JC1401500]
收录类别SCI
资助者National Natural Science Fund [51132004, 11474096]; Shanghai Municipal Science and Technology Commission [14JC1401500] ; National Natural Science Fund [51132004, 11474096]; Shanghai Municipal Science and Technology Commission [14JC1401500] ; National Natural Science Fund [51132004, 11474096]; Shanghai Municipal Science and Technology Commission [14JC1401500] ; National Natural Science Fund [51132004, 11474096]; Shanghai Municipal Science and Technology Commission [14JC1401500]
WOS记录号WOS:000405917800001
引用统计
被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.siom.ac.cn/handle/181231/28572
专题强场激光物理国家重点实验室
通讯作者yangyan@siom.ac.cn; zrsun@phy.ecnu.edu.cn
作者单位中国科学院上海光学精密机械研究所
推荐引用方式
GB/T 7714
Qi, Yingpeng,Pei, Minjie,Qi, Dalong,et al. Coulomb interaction-induced jitter amplification in RF-compressed high-brightness electron source ultrafast electron diffraction[J]. New J. Phys.,2017,19.
APA Qi, Yingpeng.,Pei, Minjie.,Qi, Dalong.,Li, Jing.,Yang, Yan.,...&zrsun@phy.ecnu.edu.cn.(2017).Coulomb interaction-induced jitter amplification in RF-compressed high-brightness electron source ultrafast electron diffraction.New J. Phys.,19.
MLA Qi, Yingpeng,et al."Coulomb interaction-induced jitter amplification in RF-compressed high-brightness electron source ultrafast electron diffraction".New J. Phys. 19(2017).
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