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Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers
Ding, Chenliang; Wei, Jingsong; Li, Qisong; Liang, Xin; Wei, Tao; weijingsong@siom.ac.cn
2016
发表期刊Opt. Lett.
卷号41期号:7页码:1550
摘要The resolution of light imaging is required to extend beyond the Abbe limit to the subdiffraction, or even nanoscale. In this Letter, we propose to extend the resolution of scanning optical microscopy (SOM) beyond the Abbe limit as a kind of subdiffraction imaging technology through the assistance of InSb thin layers due to obvious nonlinear saturation absorption and reversible formation of an optical pinhole channel. The results show that the imaging resolution is greatly improved compared with the SOM itself. This work provides a way to improve the resolution of SOM without changing the SOM itself, but through the assistance of InSb thin layers. This is also a simple and practical way to extend the resolution of SOM beyond the Abbe limit. (C) 2016 Optical Society of America
文章类型Article
部门归属存储
DOI10.1364/OL.41.001550
资助者National Natural Science Foundation of China (NSFC) [51172253, 61137002] ; National Natural Science Foundation of China (NSFC) [51172253, 61137002] ; National Natural Science Foundation of China (NSFC) [51172253, 61137002] ; National Natural Science Foundation of China (NSFC) [51172253, 61137002]
收录类别SCI
资助者National Natural Science Foundation of China (NSFC) [51172253, 61137002] ; National Natural Science Foundation of China (NSFC) [51172253, 61137002] ; National Natural Science Foundation of China (NSFC) [51172253, 61137002] ; National Natural Science Foundation of China (NSFC) [51172253, 61137002]
WOS记录号WOS:000373225400062
引用统计
文献类型期刊论文
条目标识符http://ir.siom.ac.cn/handle/181231/28234
专题高密度光存储技术实验室
通讯作者weijingsong@siom.ac.cn
作者单位中国科学院上海光学精密机械研究所
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GB/T 7714
Ding, Chenliang,Wei, Jingsong,Li, Qisong,et al. Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers[J]. Opt. Lett.,2016,41(7):1550.
APA Ding, Chenliang,Wei, Jingsong,Li, Qisong,Liang, Xin,Wei, Tao,&weijingsong@siom.ac.cn.(2016).Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers.Opt. Lett.,41(7),1550.
MLA Ding, Chenliang,et al."Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers".Opt. Lett. 41.7(2016):1550.
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