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Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers
Ding, Chenliang; Wei, Jingsong; Li, Qisong; Liang, Xin; Wei, Tao; weijingsong@siom.ac.cn
2016
Source PublicationOpt. Lett.
Volume41Issue:7Pages:1550
AbstractThe resolution of light imaging is required to extend beyond the Abbe limit to the subdiffraction, or even nanoscale. In this Letter, we propose to extend the resolution of scanning optical microscopy (SOM) beyond the Abbe limit as a kind of subdiffraction imaging technology through the assistance of InSb thin layers due to obvious nonlinear saturation absorption and reversible formation of an optical pinhole channel. The results show that the imaging resolution is greatly improved compared with the SOM itself. This work provides a way to improve the resolution of SOM without changing the SOM itself, but through the assistance of InSb thin layers. This is also a simple and practical way to extend the resolution of SOM beyond the Abbe limit. (C) 2016 Optical Society of America
SubtypeArticle
Department存储
DOI10.1364/OL.41.001550
Funding OrganizationNational Natural Science Foundation of China (NSFC) [51172253, 61137002] ; National Natural Science Foundation of China (NSFC) [51172253, 61137002] ; National Natural Science Foundation of China (NSFC) [51172253, 61137002] ; National Natural Science Foundation of China (NSFC) [51172253, 61137002]
Indexed BySCI
Funding OrganizationNational Natural Science Foundation of China (NSFC) [51172253, 61137002] ; National Natural Science Foundation of China (NSFC) [51172253, 61137002] ; National Natural Science Foundation of China (NSFC) [51172253, 61137002] ; National Natural Science Foundation of China (NSFC) [51172253, 61137002]
WOS IDWOS:000373225400062
Citation statistics
Document Type期刊论文
Identifierhttp://ir.siom.ac.cn/handle/181231/28234
Collection高密度光存储技术实验室
Corresponding Authorweijingsong@siom.ac.cn
Affiliation中国科学院上海光学精密机械研究所
Recommended Citation
GB/T 7714
Ding, Chenliang,Wei, Jingsong,Li, Qisong,et al. Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers[J]. Opt. Lett.,2016,41(7):1550.
APA Ding, Chenliang,Wei, Jingsong,Li, Qisong,Liang, Xin,Wei, Tao,&weijingsong@siom.ac.cn.(2016).Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers.Opt. Lett.,41(7),1550.
MLA Ding, Chenliang,et al."Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers".Opt. Lett. 41.7(2016):1550.
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