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Fourier-Transform Ghost Imaging with Hard X Rays
Yu, Hong; Lu, Ronghua; Han, Shensheng; Xie, Honglan; Du, Guohao; Xiao, Tiqiao; Zhu, Daming; sshan@mail.shcnc.ac.cn
2016
Source PublicationPhys. Rev. Lett.
Volume117Issue:11
AbstractKnowledge gained through x-ray crystallography fostered structural determination of materials and greatly facilitated the development of modern science and technology in the past century. However, it is only applied to crystalline structures and cannot resolve noncrystalline materials. Here we demonstrate a novel lensless Fourier-transform ghost imaging method with pseudothermal hard x rays that extends x-ray crystallography to noncrystalline samples. By measuring the second-order intensity correlation function of the light, Fourier-transform diffraction pattern of a complex amplitude sample is achieved at the Fresnel region in our experiment and the amplitude and phase distributions of the sample in the spatial domain are retrieved successfully. For the first time, ghost imaging is experimentally realized with x rays. Since a highly coherent x-ray source is not required, the method can be implemented with laboratory x-ray sources and it also provides a potential solution for lensless diffraction imaging with fermions, such as neutrons and electrons where intensive coherent sources usually are not available.
SubtypeArticle
Department量光
DOI10.1103/PhysRevLett.117.113901
Funding OrganizationNational High Technology Research and Development Program of China [2013AA122901, 2013AA122902]; National Natural Science Foundation of China [11105205]; Natural Science Foundation of Shanghai [09JC1415000] ; National High Technology Research and Development Program of China [2013AA122901, 2013AA122902]; National Natural Science Foundation of China [11105205]; Natural Science Foundation of Shanghai [09JC1415000] ; National High Technology Research and Development Program of China [2013AA122901, 2013AA122902]; National Natural Science Foundation of China [11105205]; Natural Science Foundation of Shanghai [09JC1415000] ; National High Technology Research and Development Program of China [2013AA122901, 2013AA122902]; National Natural Science Foundation of China [11105205]; Natural Science Foundation of Shanghai [09JC1415000]
Indexed BySCI
Funding OrganizationNational High Technology Research and Development Program of China [2013AA122901, 2013AA122902]; National Natural Science Foundation of China [11105205]; Natural Science Foundation of Shanghai [09JC1415000] ; National High Technology Research and Development Program of China [2013AA122901, 2013AA122902]; National Natural Science Foundation of China [11105205]; Natural Science Foundation of Shanghai [09JC1415000] ; National High Technology Research and Development Program of China [2013AA122901, 2013AA122902]; National Natural Science Foundation of China [11105205]; Natural Science Foundation of Shanghai [09JC1415000] ; National High Technology Research and Development Program of China [2013AA122901, 2013AA122902]; National Natural Science Foundation of China [11105205]; Natural Science Foundation of Shanghai [09JC1415000]
WOS IDWOS:000383247500006
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Document Type期刊论文
Identifierhttp://ir.siom.ac.cn/handle/181231/27783
Collection量子光学重点实验室
Corresponding Authorsshan@mail.shcnc.ac.cn
Affiliation中国科学院上海光学精密机械研究所
Recommended Citation
GB/T 7714
Yu, Hong,Lu, Ronghua,Han, Shensheng,et al. Fourier-Transform Ghost Imaging with Hard X Rays[J]. Phys. Rev. Lett.,2016,117(11).
APA Yu, Hong.,Lu, Ronghua.,Han, Shensheng.,Xie, Honglan.,Du, Guohao.,...&sshan@mail.shcnc.ac.cn.(2016).Fourier-Transform Ghost Imaging with Hard X Rays.Phys. Rev. Lett.,117(11).
MLA Yu, Hong,et al."Fourier-Transform Ghost Imaging with Hard X Rays".Phys. Rev. Lett. 117.11(2016).
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