| Correlated imaging for a reflective target with a smooth or rough surface | |
| Gong, Wenlin; gongwl@siom.ac.cn | |
| 2016 | |
| Source Publication | J. Opt.
 |
| Volume | 18Issue:8 |
| Abstract | Correlated imaging for a reflective target with a smooth or rough surface is investigated. Our analytical results, which are backed up by numerical simulations, demonstrate that for a reflective target with a smooth surface, the quality of ghost imaging is related with the transverse sizes of both the source and the detector in the object path, and the target's information can also be obtained by the technique of Fourier-transform ghost diffraction. However, for a reflective target with a rough surface, the target's whole image can be reconstructed by ghost imaging even using a single point-like detector but Fourier-transform ghost diffraction is invalid. The application of correlated imaging in remote sensing is also discussed based on the above results. |
| Subtype | Article |
| Department | 量光 |
| DOI | 10.1088/2040-8978/18/8/085702 |
| Funding Organization | Hi-Tech Research and Development Program of China [2013AA122901]; National Natural Science Foundation of China [61571427]; Youth Innovation Promotion Association CAS [2013162] ; Hi-Tech Research and Development Program of China [2013AA122901]; National Natural Science Foundation of China [61571427]; Youth Innovation Promotion Association CAS [2013162] ; Hi-Tech Research and Development Program of China [2013AA122901]; National Natural Science Foundation of China [61571427]; Youth Innovation Promotion Association CAS [2013162] ; Hi-Tech Research and Development Program of China [2013AA122901]; National Natural Science Foundation of China [61571427]; Youth Innovation Promotion Association CAS [2013162] |
| Indexed By | SCI |
| Funding Organization | Hi-Tech Research and Development Program of China [2013AA122901]; National Natural Science Foundation of China [61571427]; Youth Innovation Promotion Association CAS [2013162] ; Hi-Tech Research and Development Program of China [2013AA122901]; National Natural Science Foundation of China [61571427]; Youth Innovation Promotion Association CAS [2013162] ; Hi-Tech Research and Development Program of China [2013AA122901]; National Natural Science Foundation of China [61571427]; Youth Innovation Promotion Association CAS [2013162] ; Hi-Tech Research and Development Program of China [2013AA122901]; National Natural Science Foundation of China [61571427]; Youth Innovation Promotion Association CAS [2013162] |
| WOS ID | WOS:000390219800002 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.siom.ac.cn/handle/181231/27769 |
| Collection | 量子光学重点实验室 |
| Corresponding Author | gongwl@siom.ac.cn |
| Affiliation | 中国科学院上海光学精密机械研究所 |
| Recommended Citation GB/T 7714 | Gong, Wenlin,gongwl@siom.ac.cn. Correlated imaging for a reflective target with a smooth or rough surface[J]. J. Opt.,2016,18(8). |
| APA | Gong, Wenlin,&gongwl@siom.ac.cn.(2016).Correlated imaging for a reflective target with a smooth or rough surface.J. Opt.,18(8). |
| MLA | Gong, Wenlin,et al."Correlated imaging for a reflective target with a smooth or rough surface".J. Opt. 18.8(2016). |
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