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Compact transient-grating self-referenced spectral interferometry for sub-nanojoule femtosecond pulse characterization
Shen, Xiong; Wang, Peng; Liu, Jun; Li, Ruxin; jliu@siom.ac.cn
2017
Source PublicationAppl. Optics
Volume56Issue:3Pages:582
AbstractThe self-referenced spectral interferometry (SRSI) technique, which is usually used for microjoule-level femtosecond pulse characterization, is improved to characterize weak femtosecond pulses with nanojoule based on the transient-grating effect. Both femtosecond pulses from an amplifier with 3 nJ per pulse at 1 kHz repetition rates and femtosecond pulses from an oscillator with less than 0.5 nJ per pulse at 84 MHz repetition rates are successfully characterized. Furthermore, through a special design, the optical setup of the device is even smaller than a palm, which will make it simple and convenient during the application. These improvements extend the application of the SRSI technique to the characterization of femtosecond pulses in a broad range. Not only pulses from an amplifier but also pulses from an oscillator or weak pulses used in ultrafast spectroscopy can be monitored with this SRSI method right now. (C) 2017 Optical Society of America
SubtypeArticle
Department强光
DOI10.1364/AO.56.000582
Funding OrganizationNational Natural Science Foundation of China (NSFC) [11274327, 61521093, 61527821]; Instrument Developing Project of the Chinese Academy of Sciences (CAS) [YZ201538]; Strategic Priority Research Program of the Chinese Academy of Sciences (CAS) [XDB16] ; National Natural Science Foundation of China (NSFC) [11274327, 61521093, 61527821]; Instrument Developing Project of the Chinese Academy of Sciences (CAS) [YZ201538]; Strategic Priority Research Program of the Chinese Academy of Sciences (CAS) [XDB16] ; National Natural Science Foundation of China (NSFC) [11274327, 61521093, 61527821]; Instrument Developing Project of the Chinese Academy of Sciences (CAS) [YZ201538]; Strategic Priority Research Program of the Chinese Academy of Sciences (CAS) [XDB16] ; National Natural Science Foundation of China (NSFC) [11274327, 61521093, 61527821]; Instrument Developing Project of the Chinese Academy of Sciences (CAS) [YZ201538]; Strategic Priority Research Program of the Chinese Academy of Sciences (CAS) [XDB16]
Indexed BySCI
Funding OrganizationNational Natural Science Foundation of China (NSFC) [11274327, 61521093, 61527821]; Instrument Developing Project of the Chinese Academy of Sciences (CAS) [YZ201538]; Strategic Priority Research Program of the Chinese Academy of Sciences (CAS) [XDB16] ; National Natural Science Foundation of China (NSFC) [11274327, 61521093, 61527821]; Instrument Developing Project of the Chinese Academy of Sciences (CAS) [YZ201538]; Strategic Priority Research Program of the Chinese Academy of Sciences (CAS) [XDB16] ; National Natural Science Foundation of China (NSFC) [11274327, 61521093, 61527821]; Instrument Developing Project of the Chinese Academy of Sciences (CAS) [YZ201538]; Strategic Priority Research Program of the Chinese Academy of Sciences (CAS) [XDB16] ; National Natural Science Foundation of China (NSFC) [11274327, 61521093, 61527821]; Instrument Developing Project of the Chinese Academy of Sciences (CAS) [YZ201538]; Strategic Priority Research Program of the Chinese Academy of Sciences (CAS) [XDB16]
WOS IDWOS:000393347900060
Citation statistics
Document Type期刊论文
Identifierhttp://ir.siom.ac.cn/handle/181231/27577
Collection强场激光物理国家重点实验室
Corresponding Authorjliu@siom.ac.cn
Affiliation中国科学院上海光学精密机械研究所
Recommended Citation
GB/T 7714
Shen, Xiong,Wang, Peng,Liu, Jun,et al. Compact transient-grating self-referenced spectral interferometry for sub-nanojoule femtosecond pulse characterization[J]. Appl. Optics,2017,56(3):582.
APA Shen, Xiong,Wang, Peng,Liu, Jun,Li, Ruxin,&jliu@siom.ac.cn.(2017).Compact transient-grating self-referenced spectral interferometry for sub-nanojoule femtosecond pulse characterization.Appl. Optics,56(3),582.
MLA Shen, Xiong,et al."Compact transient-grating self-referenced spectral interferometry for sub-nanojoule femtosecond pulse characterization".Appl. Optics 56.3(2017):582.
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