KMS Shanghai Institute of Optics and Fine Mechanics, CAS
| Two-degree-freedom displacement measurement based on a short period grating in symmetric Littrow configuration | |
| Lu, Yancong; Wei, Chunlong; Jia, Wei; Li, Shubin; Yu, Junjie; Li, Minkang; Xiang, Changcheng; Xiang, Xiansong; Wang, Jin; Ma, Jianyong; Zhou, Changhe; chazhou@mail.shcnc.ac.cn | |
| 2016 | |
| Source Publication | Opt. Commun.
 |
| Volume | 380Pages:382 |
| Abstract | An optical encoder based on symmetric Littrow configuration is presented. Although the grating is one dimensional, both horizontal and vertical displacement can be measured simultaneously. The angle between grating vector and horizontal movement is taken into account in the measurement results, which not only decreases the requirement of installation but also decreases the cosine error. Thanks to the short grating period of 561.8 nm, a high resolution of 0.137 nm is obtained. The measurement results of optical encoder are compared with that of commercial laser interferometer. The coincident results demonstrate that the encoder should be a useful optical measurement device for detecting two-dimensional movement. (C) 2016 Published by Elsevier B.V. |
| Subtype | Article |
| Department | 信息光电 |
| DOI | 10.1016/j.optcom.2016.06.016 |
| Funding Organization | National Natural Science Foundation of China (NSFC) [61405214, 61308077, 61127013] ; National Natural Science Foundation of China (NSFC) [61405214, 61308077, 61127013] ; National Natural Science Foundation of China (NSFC) [61405214, 61308077, 61127013] ; National Natural Science Foundation of China (NSFC) [61405214, 61308077, 61127013] |
| Indexed By | SCI |
| Funding Organization | National Natural Science Foundation of China (NSFC) [61405214, 61308077, 61127013] ; National Natural Science Foundation of China (NSFC) [61405214, 61308077, 61127013] ; National Natural Science Foundation of China (NSFC) [61405214, 61308077, 61127013] ; National Natural Science Foundation of China (NSFC) [61405214, 61308077, 61127013] |
| WOS ID | WOS:000382793800056 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.siom.ac.cn/handle/181231/27543 |
| Collection | 信息光学与光电技术实验室 |
| Corresponding Author | chazhou@mail.shcnc.ac.cn |
| Affiliation | 中国科学院上海光学精密机械研究所 |
| Recommended Citation GB/T 7714 | Lu, Yancong,Wei, Chunlong,Jia, Wei,et al. Two-degree-freedom displacement measurement based on a short period grating in symmetric Littrow configuration[J]. Opt. Commun.,2016,380:382. |
| APA | Lu, Yancong.,Wei, Chunlong.,Jia, Wei.,Li, Shubin.,Yu, Junjie.,...&chazhou@mail.shcnc.ac.cn.(2016).Two-degree-freedom displacement measurement based on a short period grating in symmetric Littrow configuration.Opt. Commun.,380,382. |
| MLA | Lu, Yancong,et al."Two-degree-freedom displacement measurement based on a short period grating in symmetric Littrow configuration".Opt. Commun. 380(2016):382. |
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