SIOM OpenIR  > 高密度光存储技术实验室
对大尺寸全息光栅曝光系统中干涉条纹锁定技术的研究
张栋; 徐文东; 闫昱琪
2016
Source Publication第十六届全国光学测试学术交流会摘要集
Department存储
Abstract大尺寸全息光栅曝光时,由于干涉曝光区域面积较大,在外界环境的长时间干扰下,曝光条纹的空间周期和姿态都可能发生变化,因而曝光条纹的锁定不仅包括平移,还包括空间周期及条纹旋转角度的锁定。通过曝光光栅上下左右四组条纹监视系统,编写基于lab VIEW的监视程序,使用PZT补偿光路,实现了曝光条纹的状态锁定。条纹监视系统由参考光栅、毛玻璃、中继镜和CCD构成,参考光栅的光栅常数为曝光
Language中文
Document Type会议论文
Identifierhttp://ir.siom.ac.cn/handle/181231/27433
Collection高密度光存储技术实验室
Affiliation中国科学院上海光学精密机械研究所
Recommended Citation
GB/T 7714
张栋,徐文东,闫昱琪. 对大尺寸全息光栅曝光系统中干涉条纹锁定技术的研究[C],2016.
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