SIOM OpenIR  > 高功率激光物理国家实验室
相干调制成像技术测量大口径光学元件复振幅透过率
陶华; 潘兴臣; 刘诚; 朱健强
2016
Source Publication第十六届全国光学测试学术交流会摘要集
Department联合
Abstract高功率激光驱动器中使用了大量的大口径光学元件,光学元件质量的好坏直接影响驱动器的整体性能,因此对于每块大口径光学元件都需要进行精确的测量与安装。传统的光学元件复振幅透过率测量是采用大口径干涉仪进行,但是对于某些特殊的元件,例如面型高度不规则的用于光束匀滑的连续分布相位板(CPP),由于其具有较大的相位变化梯度,实际中使用干涉仪测量难以进行。相干调制成像(CMI)技术是为了克服
Language中文
Document Type会议论文
Identifierhttp://ir.siom.ac.cn/handle/181231/27389
Collection高功率激光物理国家实验室
Affiliation中国科学院上海光学精密机械研究所
Recommended Citation
GB/T 7714
陶华,潘兴臣,刘诚,等. 相干调制成像技术测量大口径光学元件复振幅透过率[C],2016.
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