基于表面等离子体共振效应的金属薄膜参数测量技术

SIOM OpenIR > 信息光学与光电技术实验室

	基于表面等离子体共振效应的金属薄膜参数测量技术
	谷利元; 曾爱军; 胡国行; 贺洪波; 黄惠杰
	2016
Source Publication	第十六届全国光学测试学术交流会摘要集
Department	信息光电
Language	中文
Document Type	会议论文
Identifier	http://ir.siom.ac.cn/handle/181231/27363
Collection	信息光学与光电技术实验室
Recommended Citation GB/T 7714	谷利元,曾爱军,胡国行,等. 基于表面等离子体共振效应的金属薄膜参数测量技术[C],2016.

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