SIOM OpenIR  > 信息光学与光电技术实验室
基于表面等离子体共振效应的金属薄膜参数测量技术
谷利元; 曾爱军; 胡国行; 贺洪波; 黄惠杰
2016
Source Publication第十六届全国光学测试学术交流会摘要集
Department信息光电
Language中文
Document Type会议论文
Identifierhttp://ir.siom.ac.cn/handle/181231/27363
Collection信息光学与光电技术实验室
Recommended Citation
GB/T 7714
谷利元,曾爱军,胡国行,等. 基于表面等离子体共振效应的金属薄膜参数测量技术[C],2016.
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