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题名:
Measurement of the wavefront of a laser diode system for intersatellite communication by a Jamin double-shearing interferometer
作者: Liu HZ ; Liu LR(刘立人) ; Xu RW ; Zhang L
关键词: semiconductor laser diode ; double-shearing interferometer ; divergence ; diffraction-limited
刊名: J. Opt. A-Pure Appl. Opt.
发表日期: 2005
卷: 7, 期:3, 页:142
收录类别: ei
摘要: The frame of a laser diode transmitter for intersatellite communication is concisely introduced. A simple, novel and visual method for measuring the diffraction-limited wavefront of the transmitter by a Jamin double-shearing interferometer is proposed. To verify the validity of the measurement, the far-field divergence of beam is additionally rigorously analysed in terms of the Fraunhofer diffraction. The measurement, the necessary analyses and discussion are given in detail. By directly measuring the fringe widths and quantitatively interpreting the interference fringes, the minimum detectable wavefront height (DWH) of the wavefront is only 0.2 gimel (the distance between the perfect plane wavefront and the actual wavefront at the transmitting aperture) and the corresponding divergence is only 65.84 mu rad. This indicates that the wavefront approaches the diffraction-limited condition. The results show that this interferometer is a powerful tool for testing the semiconductor laser beam's wavefront, especially the diffraction-limited wavefront.
语种: 英语
WOS记录号: WOS:000228114600008
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.siom.ac.cn/handle/181231/2074
Appears in Collections:信息光学开放实验室_期刊论文

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Recommended Citation:
Liu HZ,Liu LR,Xu RW,et al. Measurement of the wavefront of a laser diode system for intersatellite communication by a Jamin double-shearing interferometer[J]. J. Opt. A-Pure Appl. Opt.,2005,7(3):142, 146.
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