SIOM OpenIR  > 高密度光存储技术实验室
TeO_x和Ag-In-Sb-Te-O薄膜动态存储特性的测试
Alternative TitleTesting of Dynamic Recording Properties for TeO_x and Ag-In-Sb-Te-O Thin Films
李青会; 顾冬红; 干福熹
2003
Source Publication中国激光
Volume30Issue:5Pages:445
Abstract采用真空蒸镀法制备了以TeO_x薄膜为记录层的可录光盘,采用溅射法制备了以Ag-In-Sb-Te-O为记录层的可擦重写光盘,并测试了这两种光盘在波长为514.5 nm的动态存储特性。实验结果表明,可录光盘的载噪比在波长514.5 nm时达到30 dB,波长780 nm时达到41 dB;可擦重写光盘的载噪比在波长514.5 nm时达到25 dB,波长780 nm时达到38 dB。对光盘载噪比偏低的可能原因及改进方法进行了讨论。光盘动态存储性能测试证明了这两种薄膜可用作蓝绿光波段高密度光存储介质。
SubtypeArticle
Other AbstractThe recordable disks using TeO_x thin films as the recording medium and the erasable disks using Ag-In-Sb-Te-O thin films as the recording medium were fabricated by the methods of vacuum evaporation and by the method of sputtering, respectively. Dynamic recording properties of the two kinds of disks at 514.5 nm were reported. The carrier to noise ratio (CNR) of the recordable disk could reach about 30 dB at 514.5 nm and 41 dB at 780 nm; that of the erasable disk could reach about 25 dB at 514.5 nm and 38 dB at 780 nm. The reasons which caused the low CNR were discussed. The two kinds of films had the potential for using as blue-green short-wavelength high density optical storage media.
Funding Organization国家自然科学基金(59832060)资助课题 ; 国家自然科学基金(59832060)资助课题
Indexed ByEI
Language中文
Funding Organization国家自然科学基金(59832060)资助课题 ; 国家自然科学基金(59832060)资助课题
Document Type期刊论文
Version出版稿
Identifierhttp://ir.siom.ac.cn/handle/181231/18398
Collection高密度光存储技术实验室
Affiliation1.Li Qinghui, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800, China.
2.Gu Donghong, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800, China.
3.Gan Fuxi, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800, China.
Recommended Citation
GB/T 7714
李青会,顾冬红,干福熹. TeO_x和Ag-In-Sb-Te-O薄膜动态存储特性的测试[J]. 中国激光,2003,30(5):445.
APA 李青会,顾冬红,&干福熹.(2003).TeO_x和Ag-In-Sb-Te-O薄膜动态存储特性的测试.中国激光,30(5),445.
MLA 李青会,et al."TeO_x和Ag-In-Sb-Te-O薄膜动态存储特性的测试".中国激光 30.5(2003):445.
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