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Laser induced fractal structure on magnetic dielectric thin film
Lou QH(楼祺洪); Huang F(黄峰)
2003
Source PublicationChin. Opt. Lett.
Volume1Issue:4Pages:231
AbstractThe Richardson plots method is employed to measure the fractal dimensions D of the surface of magneticdielectric film fractured by excimer laser irradiation near the ablation threshold. It is shown that thefractured surfaces are fractal character. The value of D decreases while the laser pulse number increases.This relation may reflect how the fractured surface changes from irregular structure to regular structurewith laser pulse number.
SubtypeArticle
Funding OrganizationShanghai ScienceFoundation under Grant ; Shanghai ScienceFoundation under Grant
Indexed ByEI
Language英语
Funding OrganizationShanghai ScienceFoundation under Grant ; Shanghai ScienceFoundation under Grant
Document Type期刊论文
Version出版稿
Identifierhttp://ir.siom.ac.cn/handle/181231/18212
Collection先进激光技术与应用系统实验室
Affiliation1.Lou Qihong, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of sciences, ShangHai 201800, China.
2.Huang Feng, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of sciences, ShangHai 201800, China.
Recommended Citation
GB/T 7714
Lou QH,Huang F. Laser induced fractal structure on magnetic dielectric thin film[J]. Chin. Opt. Lett.,2003,1(4):231.
APA 楼祺洪,&黄峰.(2003).Laser induced fractal structure on magnetic dielectric thin film.Chin. Opt. Lett.,1(4),231.
MLA 楼祺洪,et al."Laser induced fractal structure on magnetic dielectric thin film".Chin. Opt. Lett. 1.4(2003):231.
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