Near-field speckles produced by random self-affine surfaces and their contrast transitions | |
Cheng, CF; Liu, CX; Ren, XR; Liu, M; Teng, SY; Xu, ZZ; Cheng, CF, Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, POB 800-211, Shanghai, Peoples R China | |
2003 | |
Source Publication | Opt. Lett.
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Volume | 28Issue:17Pages:1531 |
Abstract | By use of a numerical calculation based on Green's integral equation, we study the near-field speckles produced by the random self-affine fractal surfaces of a dielectric medium. The speckle intensities evolve considerably in the near-field region, and the local fluctuations in them disappear before they have traversed the distance of a wavelength. The transition of the speckle contrast either on the surface or in the near field and in the neighborhood non-near-field regions depends on lateral correlation length xi and roughness exponent alpha of the random surfaces. (C) 2003 Optical Society of America. |
Subtype | Article |
Indexed By | SCI |
Language | 英语 |
WOS ID | ISI:000184836900011 |
Citation statistics | |
Document Type | 期刊论文 |
Version | 出版稿 |
Identifier | http://ir.siom.ac.cn/handle/181231/18065 |
Collection | 强场激光物理国家重点实验室 |
Corresponding Author | Cheng, CF, Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, POB 800-211, Shanghai, Peoples R China |
Affiliation | 1.Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai, Peoples R China 2.Shandong Normal Hosp, Dept Phys, Shandong 250014, Peoples R China |
Recommended Citation GB/T 7714 | Cheng, CF,Liu, CX,Ren, XR,et al. Near-field speckles produced by random self-affine surfaces and their contrast transitions[J]. Opt. Lett.,2003,28(17):1531. |
APA | Cheng, CF.,Liu, CX.,Ren, XR.,Liu, M.,Teng, SY.,...&Cheng, CF, Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, POB 800-211, Shanghai, Peoples R China.(2003).Near-field speckles produced by random self-affine surfaces and their contrast transitions.Opt. Lett.,28(17),1531. |
MLA | Cheng, CF,et al."Near-field speckles produced by random self-affine surfaces and their contrast transitions".Opt. Lett. 28.17(2003):1531. |
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