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AgInSbTe薄膜的短波长记录性能分析
Alternative TitleAnalysis of Short-Wavelength Recording Properties of AgInSbte Thin Films
魏劲松; 阮昊; 陈仲裕; 干福熹
2002
Source Publication光学学报
Volume22Issue:11Pages:1281
Abstract采用自制的装置研究了Ag_5In_5Sb_(47)Te_(33)薄膜的静态记录性能与记录激光的功率和脉冲宽度的关系,并对其记录畴形貌特点进行了直接观察。结果表明只有记录激光的功率和脉冲宽度在一定范围之内才能起到信息记录的作用,所得的记录畴形貌十分清晰,基本为非晶态Ag_5In_5Sb_(47)Te_(33);小于该范围的激光能量不能使材料结构发生较大的变化,所得的记录畴形貌模糊,反射率对比度低于2%;大于该范围所得的记录畴由烧蚀区和其周围的非晶态Ag_5In_5Sb_(47)Te_(33)组成。另外,得到
SubtypeArticle
Other AbstractThe relationships between the recording properties and the recording laser power and pulse width of the Ag_5In_5Sb_(47) Te_(33) thin films were investigated and the recording domains morphology was observed. The results showed that the recording domains could be obtained when the recording laser power and pulse width were within a certain range, and the morphology of the recording domains is very clear and is amorphous Ag_5In_5Sb_(47)Te_(33). When the laser power and pulse width could not provide efficient energy to induce significant change in the films, the morphology of the recording domains is very illegible. When the ablation took place the recording domains were composed of the ablation area and the surrounding amorphous Ag_5In_5Sb_(47)Te_(33). In addition, the optimum recording conditions (12 mW recording power and the 90 ns laser pulse width) were obtained, the reflectivity contrast of the recording domains obtained under the condition is 22% and the domain diameter is 380 nm~400 nm.
Funding Organization国家自然科学基金重点项目(59832060) ; 国家基础研究973项目 ; 上海市应用物理研究中心资助课题 ; 国家自然科学基金重点项目(59832060) ; 国家基础研究973项目 ; 上海市应用物理研究中心资助课题
Indexed ByEI
Language中文
Funding Organization国家自然科学基金重点项目(59832060) ; 国家基础研究973项目 ; 上海市应用物理研究中心资助课题 ; 国家自然科学基金重点项目(59832060) ; 国家基础研究973项目 ; 上海市应用物理研究中心资助课题
Document Type期刊论文
Version出版稿
Identifierhttp://ir.siom.ac.cn/handle/181231/17834
Collection高密度光存储技术实验室
Affiliation1.魏劲松, 中国科学院上海光学精密机械研究所, 上海 201800, 中国.
2.阮昊, 中国科学院上海光学精密机械研究所, 上海 201800, 中国.
3.陈仲裕, 中国科学院上海光学精密机械研究所, 上海 201800, 中国.
4.干福熹, 中国科学院上海光学精密机械研究所, 上海 201800, 中国.
Recommended Citation
GB/T 7714
魏劲松,阮昊,陈仲裕,等. AgInSbTe薄膜的短波长记录性能分析[J]. 光学学报,2002,22(11):1281.
APA 魏劲松,阮昊,陈仲裕,&干福熹.(2002).AgInSbTe薄膜的短波长记录性能分析.光学学报,22(11),1281.
MLA 魏劲松,et al."AgInSbTe薄膜的短波长记录性能分析".光学学报 22.11(2002):1281.
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