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Measurement of random surface parameters of weak scatterers using the speckle contrast method
Cheng CF(程传福); Liu CX(刘春香); Teng SY(滕树云); Zhang NY(张宁玉); Li RX(李儒新); Xu ZZ(徐至展); Cheng, CF (reprint author), Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, POB 800-211, Shanghai 201800, Peoples R China.
2002
Source PublicationChin. Phys. Lett.
Volume19Issue:9Pages:1283
AbstractTheoretical analysis shows that the deviation roughness w and the lateral correlation length xi of a weak scattering object determine the different properties of the contrast of the speckles in the image plane of a 4f system. Experimentally, we have measured the data of the speckle contrast versus the radius R of the variable filtering aperture. By fitting the theoretical results to these data, we extract the parameters w and xi of the random surfaces with Gaussian correlation. This method can determine the two parameters simultaneously and independently, and pre-calibrations are not needed.
SubtypeArticle
Indexed BySCI
Language英语
WOS IDWOS:000178088500020
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Cited Times:4[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Version出版稿
Identifierhttp://ir.siom.ac.cn/handle/181231/17743
Collection强场激光物理国家重点实验室
Corresponding AuthorCheng, CF (reprint author), Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, POB 800-211, Shanghai 201800, Peoples R China.
Affiliation1.Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China
2.Shandong Normal Univ, Dept Phys, Jinan 250014, Peoples R China
3.Shandong Inst Architecture, Jinan 250014, Peoples R China
Recommended Citation
GB/T 7714
Cheng CF,Liu CX,Teng SY,et al. Measurement of random surface parameters of weak scatterers using the speckle contrast method[J]. Chin. Phys. Lett.,2002,19(9):1283.
APA 程传福.,刘春香.,滕树云.,张宁玉.,李儒新.,...&Cheng, CF .(2002).Measurement of random surface parameters of weak scatterers using the speckle contrast method.Chin. Phys. Lett.,19(9),1283.
MLA 程传福,et al."Measurement of random surface parameters of weak scatterers using the speckle contrast method".Chin. Phys. Lett. 19.9(2002):1283.
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